Photothermal Radar Shearography: A Novel Transient-Based Speckle Pattern Interferometry for Depth-Tomographic Inspection

As an increasingly recognized optical interferometric technique for nondestructive testing and evaluation, shearography has attracted extensive interest in various industrial applications. However, it suffers from the ignorance of the whole process of dynamic surface deformation and the difficulty in determining the depth-resolved information of inhomogeneities. In this regard, a novel speckle pattern interferometric modality named photothermal radar shearography is proposed. Unlike the differential mode of conventional shearography, the present article focuses on the dynamic surface displacement field channel technique with more comprehensive understanding of the subsurface structural information. With the utilization of frequency modulated photothermal excitation, the depth-distributed information of subsurface structures and inhomogeneities is encoded into the induced dynamic surface deformation. Using Hilbert transform and least-square method solved by discrete cosine transform, the time-domain interference signal of each pixel from the recorded speckle patterns sequence is demodulated and unwrapped to obtain the transient full-field shearographic phase distribution which indicates the dynamic surface deformation. In the meanwhile, incrementally delayed cross-correlation matched filtering allows for the localization of axial energy distribution to generate depth-selective structural display for tomography. This proposed transient-based interferometric methodology thus enables depth-tomographic profiles and three-dimensional visualization of subsurface anomalies for the first time, which significantly improves the superiority and attractiveness of shearography in providing insight into the status, performance and reliability of industry.