Test Set Generation for Multiple Faults in Boolean Systems using SAT Solver

The detection of a stuck-at fault in the digital circuit requires a specific set of inputs, commonly known as test inputs. The fault detection problem is NP-complete, with a complexity of at least $O(2^{n})$ for $n$ faults. With an increase in the size of the circuit, and consequently the possibility of the number of faults, the generation of test inputs becomes computationally challenging. We have used the Boolean satisfiability (SAT) algorithm to deal with such complexity. MiniSAT 2.2 is a well-known SAT algorithm with a computational complexity of less than $O$(1.3ⁿ). The result of this SAT problem was obtained with MiniSAT 2.2 algorithm and python platform. The results obtained were analyzed to determine the test sets for combinational circuits. Another advantage of this method is that it is helpful for the detection of single as well as multiple-simultaneous stuck-at faults, which are even harder to detect. The method has been developed by keeping in mind its possible application in biological circuits, like detecting genetic mutations.