Abstract:
This paper studies the peak to average power ratio (PAPR) deviation in extrinsic and intrinsic device characterization for wideband applications. The analysis with a mult...Show MoreMetadata
Abstract:
This paper studies the peak to average power ratio (PAPR) deviation in extrinsic and intrinsic device characterization for wideband applications. The analysis with a multisine stimulus demonstrates that PAPR varies from the 5%-21 % from its actual synthesized value at the input in wideband scenarios, when the signal traverses each of the extrinsic matching networks of a power amplifier (PA). This variation misleads to the optimum parameters' consideration of the characterized device. The knowledge of the stimuli statistics at the different subsection of the PA can provide more comprehensive information for the optimum characterization in modulated load-pull analysis and subsequently PA design.
Published in: 2021 IEEE MTT-S International Microwave Symposium (IMS)
Date of Conference: 07-25 June 2021
Date Added to IEEE Xplore: 27 October 2021
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