Multipactor Thresholds in a Planar Test Cell

A planar test cell was designed and implemented to observe the multipactor effect in waveguide structures. This plug and play device allows for multiple geometries to be machined and easily replaced within the test structure. A direct detection method was used to observe the multipactor effect while the upper and lower thresholds were measured for a 2.1 mm gap at 2.85 GHz. While there is an obvious lower limit to multipactor (2 kW), there was no observable upper limit even at powers over 200 kW. This is attributed to the transverse electric field distribution in the dominant TE
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mode which is not taken into account in most multipactor theoretical models.