Evaluation of an X-ray area detector based on a logarithmic CMOS camera

An X-ray detector mock-up made of an X-ray image intensifier and a non-integrating, logarithmic CMOS camera has been evaluated. After calibration the instrument provides linearly scaled X-ray images over 6 decades of dynamic range, i.e. more than a 10-fold improvement over state-of-the-art 16-bit CCD-based systems. Images of 512/spl times/256 pixels are read out in 16 ms free of smearing without mechanical shuttering. A noise-limited detection threshold of 25 photons/pixel/second r.m.s. at 18 keV is achieved. Imaging capabilities are illustrated by point-spread function analysis, X-ray diffraction images obtained using a synchrotron beam, and side-by-side comparisons with CCD-based systems. Various X-ray techniques at synchrotron sources that could take advantage of the unique features of log CMOS-based X-ray detectors are suggested.