Test vector generation for high-speed digital integrated circuits

The generation of high-speed digital vector is one of the main problems in IC testing. With the increasing of the working frequency of digital circuits, the speed and accuracy of digital test vector are also required to be higher and higher. Based on FPGA high-speed transceiver, this paper provides a method of generating high-speed digital integrated circuit test vectors. It also introduces the specific implementation of high-speed digital pattern synthesis and broadening, and explains the possible situations in it. The resulting test vector speed is up to 800Mbps and the edge positioning accuracy can reach 40ps.