Research of the noise spectra in the mm-wave electrovacuum devices

In millimeter-wave backward-wave oscillators (BWO) and diffraction oscillators (DRO), the frequency instability near the carrier is stipulated by additive noise and modulation noises. In this paper, a model of the fluctuation spectrum of high-frequency oscillation BWOs and DROs near the carrier frequency was constructed. This model allows estimation of the qualitative influence of exterior additive and multiplicate noises on the oscillation frequency of resonant generators in the millimeter wave range and leads to extrapolation of experimental curves in a range of frequencies /spl omega//sub /spl alpha//<20 Hz. Further refining of the model together with experimental measurements of the natural and technical linewidth of oscillations of sectional generators will allow determination of fundamental flicker-noise components of the radiation.