Improvements and Measurements on Power Cycle Test Bench with Blocking and Switching Losses

Improving power cycle test benches offer the chance to create more realistic stress conditions for power semiconductors. For this, switching losses are added to avoid inhomogeneous load distribution between semiconductor chips or between chip and bond wire. The test bench in this paper adds also blocking losses to stress hot spots by further blocking losses. Moreover, it allows an indirect leakage current measurement, which is an early indicator. The test setup is further improved and new measurements and schematics are presented. Also, the equipment to measure Zth, especially collector-emitter voltage, with the ability to block at least 1kV is presented.