Universal Semiconductor ATPG Solutions for ATE Platform under the Trend of AI and ADAS

This article introduces a universal semiconductor Automatic Test Pattern Generation (ATPG) solution for Automated Test Equipment (ATE) platform. With the increasing trend of Artificial Intelligence (AI) and Advanced Driving Assistance System (ADAS) the communication between semiconductor devices requires advanced protocols such as Mobile Industry Processor Interface (MIPI) and Point-to-point (P2P) protocols. A designer-based solution is developed to provide a one-click software approach to create test vectors for common protocols and customized protocols. As a result, the silicon debug cycle can be massively reduced, comparing with converting waveform files generated from traditional Electronic Design Automation (EDA) tools. This solution can dramatically reduce the workload of test engineers and enable IC designers to participate in the debugging process of the device directly with an intuitive way. Such workflow can rise the efficiency of semiconductor test process and further decrease the Time to Market (TTM) of new product. This solution is designed as a comparable tool towards traditional EDA tools and will be another choice for ATPG solution. Up to now, this solution can generate test vectors for advanced protocols like MIPI D-PHY/C-PHY as well as basic protocols such as Inter-Integrated Circuit (I2C) and Serial Peripheral Interface (SPI) and complete evaluation on real device.