Assessing SiCr resistor drift for automotive analog ICs

A very stable resistor is needed for analog integrated circuits employed in harsh automotive environments. Precision SiCr thin-film resistors have been characterized by DC and pulsed I-V measurements, high-temperature operating life, and high temperature storage stress. Maximum current density for a maximum drift of 0.1% over the product lifetime are determined. Furthermore, SiCr resistors are stressed to failure and the physical failure mechanism is analyzed.