Crystallographic Texture Study of Nano-SiC-Doped MgB$_2$ Wires

In this work, we present the characterization of Ti sheathed MgB
₂
wires prepared by PIT with two different cross-sections: circular and hexagonal. We determined the crystallographic texture of both the Ti sheath and the MgB
₂
core by X-ray diffraction (XRD) pole figures. We evaluated the critical current density (J
_c
) of the wires in two different directions using a SQUID magnetometer, in order to determine the anisotropic factor of the current density (J
_af
). We found that J
_af
is larger than one and it is field independent for both wires, consistently with the increased probability to encounter the basal planes perpendicular to the axial direction (AD) obtained in the crystallographic texture.