Quantifying nanoscale electromagnetic fields in multi-THz nanoscopy

We introduce a novel Fourier demodulation analysis to numerically simulate a realistic near-field microscopy scenario. The new concept allows us to access the experimentally elusive, nanoscale distributions of the demodulated electromagnetic fields in multi-THz nanoscopy. We quantify the achievable lateral resolution as well as the probing volume inside the sample and visualize the scattering process into the far field.