Asymmetric Constraint Fourier Ptychography Microscopy

Fourier ptychography microscopy (FPM) is a phase retrieval technique, which can simultaneously realize a large field of view and high spatial resolution. Most of the related improved works of FPM focus on system construction and algorithm improvement. Several parameters such as adjacent sub-spectrum overlap ratio and recovery sequence affect the performance of the FPM framework too. In this letter, we propose an asymmetric constraint Fourier ptychography microscopy (ACFPM) framework. We demonstrate the feasibility and efficiency of the proposed framework through simulations and actual experiments. Results indicate that introducing asymmetry in the Fourier domain without considerable influence on sub-spectrum overlap ratio can evidently improve the reconstruction quality of high-resolution image.