Erratum to “A Test Response Compression Method for Monolithic 3-D ICs Based on 3-D Haar Wavelet Transforms” [2021 Art. no. 3506412]

In the above article
[1]
, the following sentence on page 5, right column, has been corrected to read as follows: for two detected faults in the Fig. 11(a) and (c) case, even if there is a big difference between their measurement values, they will have the same saved data.