Effect Characterization and Modeling of RF Low Noise Amplifier for VHF communication System after HEMP PCI Test

Effect characterization and modeling of electronic system is crucial for system-level HEMP assessment. If performance degradation occurred in an electronic system, such as the performance decline of transmitting power or receiver sensitivity etc., it would severely weaken the reliability and capability of the electronic system. The device-level effect characterization and classification for the vulnerable LNA in a VHF communication system are completed based on a certain number of fault electronic elements collected from threshold PCI test. Component-level effect modeling is also made based on the classification results according to an offline way of S parameter measurement. The results are necessary for improving the accuracy of system-level HEMP assessment and meaningful for evaluating the practical performance influence when the target electronic system stays sub-health due to the performance degradation induced by HEMP.