Distortion Compensation in Structured Lighting Systems

The article discusses a modification of the structured lighting method. The difference between the proposed method and classical optical methods for measuring the profile of objects using structured illumination is that the phase of the projected images is demodulated taking into account the change in the intensity of the set of sinusoidal patterns projected onto the object when phase shifts of a known value are introduced. This improves the quality of the measurements. An experimental verification of the proposed method has been carried out.