New Approach for Homogenization and Characterization of Substrated Metasurfaces

In this paper, we propose a methodology for characterization and homogenization of substrated metasurfaces by considering the behavior of the constituting scatterers and the interactions between them, independently. Then the proposed method is used to calculate the characteristic parameters of two different cases. At first, we consider a two-dimensional array of silicon nano-spheres placed in free space. Next, a two-dimensional array of silicon nano-spheres located on a glass substrate is studied. Finally, transmission and reflection coefficients of these metasurfaces are compared with those obtained by HFSS commercial software to show the efficiency and accuracy of the proposed method. The results are in good agreement.