Overcurrent Evaluation of Transient Process of Dual Active Bridges Under Short Circuits

This paper analyzes the detailed transient process of a dual active bridge (DAB) in the internal circuits when a short-circuit fault of load occurs, which has not been considered in the existing researches. Based on the analysis results, the blocking duration of the signals after the fault and the series inductance at the output was derived to achieve the fault ride-through. The analysis results are verified by the simulations by MATLAB/Simulink and the experiments on a 500-W prototype. The results presented in this paper provide the theoretical reference for the design of strategies for overcurrent protection and fault riding-through of DABs.