Efficient Labview Interface Technique for Laser Beam Profile Scanner

In this paper, we implemented a new laser beam profile scanning technique for measuring and plotting a laser beam profile. The scanner relied on precisely positioning a changeable phototransistor detector in a plane. The Labview software is used to control, obtain, and analyze results from the detector. The advantage of our system is the usage of a master-slave communication protocol between the Labview software and the microcontroller. Such interfacing method enabled both devices to establish errorless communication with each other. Furthermore, the communication language can be upgraded for implementation in any software/hardware device. The system also can be used for any wavelength of laser source by changing the type of detector that suitable for used laser wavelength. The results obtained from the system are promising for using the device at very low-cost applications comparing with traditional expensive scanners.