Properties of Electrical Insulation Coatings from Yttrium-stabilized Zirconia and Alumina

The results of a study of the electrical properties of dielectric film coatings of zirconia stabilized with yttrium oxide with the addition of aluminum oxide on a metal are presented. The coatings were created by electron beam evaporation using a forevacuum plasma electron source. The surface morphology and composition of the obtained films, the relative permittivity, the dielectric loss tangent, and the volume resistance of the deposited coating are studied.