A Thin Film Storage Device to Characterize the CDM Event Distribution of a Process

A Non-Volatile Memory (NVM) technology was incorporated into chips to detect, measure, and record Charge Device Mode (CDM) events experienced during package level production test. Transmission Line Pulse (TLP) and CDM test results show a V
_T
shift within the NVM bitcell that is proportional to the event discharge magnitude. The circuit can be tuned to quantify process CDM events to industry standards.