Diagnosis of tunneling opens

This paper resolves two issues regarding diagnosis of tunneling opens: efficient screening and accurate localization. In the first part, a test pattern selection and sorting algorithm is presented. It is shown that the presented algorithm saves I/sub DDQ/(t) test time without impacting on its effectiveness. The second part of this paper presents a locating algorithm which combines both VLV and I/sub DDQ/(t) test results. This technique is shown to be able to accurately locate the tunneling opens with higher resolution than commercial single stuck-at fault diagnosis tool.