Compression technique for interactive BIST application

This paper presents a compression technique that reduces the test data volume while achieving high fault coverage within a Built-In Self-Test environment. The LFSR control data target only the RPR faults. The data are further reduced using a new code. Analysis of essential attributes of the control data is performed to assess their effect on the compression technique. The scheme was applied to several benchmark cores and indicated a superior effect than previously used compression techniques.