An Improved Code-based Fault Simulation Model for PV Module

Recently, most of the fault detection and diagnosis (FDD) methods of the photovoltaic (PV) module compare the measured and simulated data, which has high requirements for the time cost and accuracy of simulating the current-voltage (I-V) curves. In addition, the I-V curves under various faulted conditions should be simulated for the FDD. In this paper, the improved code-based fast fault simulation model (ICFFSM) is proposed to simulate the I-V curves of the PV module under normal and multiple faulted conditions. It can accurately simulate the open-circuit of the bypass diode fault (OCD) compared with the CFFSM model. Then the improved Newton-Raphson method (INRM) is adopted to solve the reverse-biased single-diode model (RSDM) to improve the simulation efficiency of the ICFFSM. The adaptive step size is proposed to improve the accuracy of the simulation by uniforming the points distribution of the I-V curve. Finally, the comparison results indicate that I-V and P-V curves agree well with the results of the outdoor experiment.