Assembly Line Anomaly Detection and Root Cause Analysis Using Machine Learning

Anomaly detection is becoming widely used in Manufacturing Industry to enhance product quality. At the same time, it plays a great role in several other domains due to the fact that anomaly may reveal rare but represent an important phenomenon. The objective of this paper is to detect anomalies and identify the possible variables that caused these anomalies on historical assembly data for two series of products. Multiple anomaly detection techniques were performed; HBOS, IForest, KNN, CBLOF, OCSVM, LOF, and ABOD. Moreover, we used AUROC and Rank Power as performance metrics, followed by Boosting ensemble learning method to ensure the best anomaly detectors robustness. The techniques that gave the highest performance are KNN, ABOD for both product series datasets with 0.95 and 0.99 AUROC respectively. Finally, we applied a statistical root cause analysis on the detected anomalies with the use of Pareto chart to visualize the frequency of the possible causes and its cumulative occurrence. The results showed that there are seven rejection causes for both product series, whereas the first three causes are responsible for 85% of the rejection rates. Besides, assembly machines engineers reported a significant reduction in the rejection rates in both assembly machines after tuning the specification limits of the rejection causes identified by this research results.