Experimental Study on Single Event Latch-up of a D/A Converter

The TLV5638 of TI Company is a D/A Converter. The device is extremely sensitive to space radiation environment. It will be happened single event latch-up. In this work, the single event latch-up effect of TLV5638 of TI Company is studied by using Heavy Ion Accelerator of HI-13. According to its use, the latch-up hardness measures of the current limiting resistor are given. The value range of the current limiting resistor is calculated and the latch-up protection is verified by experiment. It is concluded that single event function interruption and error are more likely to occur when the device is irradiated at lower voltage. The effectiveness of the protection method can automatically restore the working state of the device in the case of uninterrupted power, and the device does not have single event latch-up. According to the results of this study, it can be guaranteed that TLV5638 can avoid single event latchup in space applications.