NbN multilayer technology on R-plane sapphire

A new NbN multilayer technology has been developed on 3 inch diameter R-plane sapphire substrates, for combining on-chip fast RSFQ circuits with GHz bandwidth optical links, The circuits take advantage of two high quality [110] NbN layers sputtered epitaxially on sapphire at 600/spl deg/C and selectively patterned: a 400 nm thick layer (/spl lambda//sub L//spl sim/250 nm at 6 K) acts for the ground-plane and microbridge photodetectors are made of a 3.5-8 nm thick NbN epilayer with T/sub c/ above 11 K. Innovative dielectrics formed of 10 nm thick MgO sputtered on top of 200 mm SiO/sub 2/ layers are found to improve significantly the superconductivity of NbN junction electrode lines deposited below 300/spl deg/C. Good quality, hysteretic 2 /spl mu/m/sup 2/ area, NbN/MgO/NbN junctions with high J/sub c/ (up to 50 kA/cm/sup 2/) are obtained with very large gap voltage (6.20 mV) and low sub-gap leakage current (V/sub m/>15 mV) at 4.2 K. At 11 K such junctions are found self-shunted (J/sub c//spl sim/10 k4/cm/sup 2/) with R/sub n/I/sub c/ above 0.5 mV and with low J/sub c/ spread in arrays. J/sub c/ can be adjusted (reduced) without any detrimental effect on the junction quality or spread by annealing at 250/spl deg/C.