Aging Monitoring for Memory-based ReconFigurable Logic Device (MRLD)

MRLD is a new type of reconfigurable device constructed by general SRAMs array that is promising to use for the next-generation IoT edge devices. During the operation of the MRLD, aging-induced failures may occur without any previous notice, which greatly affects the reliability of the entire IoT systems. In this paper, we propose a method for early detecting and reporting the effect of the aging in MRLD. The method configures a new designed ring oscillator circuit into the MRLD for monitoring its internal delay variations. Simulation results confirmed the effectiveness of the proposed method.