Sensitivity analysis of an adaptive open loop gate driver to manufacturing related varying IGBT parameters

In this paper the sensitivity of a new open loop gate driver is investigated, regarding to insulated gate bipolar transistor (IGBT) parameter variation, caused by manufacturing variations. For this purpose, several IGBTs of the same type from different batches, managed by the open loop driver are measured. It will be shown, that the switching behavior of the IGBTs, driven by the intelligent open loop gate driver differ only slightly from each other. So safe operation of different batches of the same IGBT module with the investigated open loop gate driver is possible without an adaptation of its control scheme. Furthermore, it is shown that the switching behavior of the respective IGBT is determined by the driver and not by the parameter variation of the driven IGBTs.