Novel GaN Half-Bridge Configuration for the Measurement of Core Losses Under Rectangular Voltages and DC-bias

An accurate calculation of core losses under rectangular voltages including DC-bias is useful for the design of switched-mode power supplies. Core loss measurements with DC-bias usually impose a DC current and thus DC-bias of the magnetic field strength on ungapped toroids. However, hardware designers require the AC and DC excitation of the magnetic flux density for the results to be of practical use. Therefore, this paper proposes a novel GaN half-bridge configuration to measure core loss under rectangular voltages at high frequencies. A new combination of pulsed operation and iteration method sets the desired DC-bias of the magnetic flux density.