President's message: Special issue highlighting AUTOTESTCON 2019

It is a pleasure to welcome you all to this special edition of our IEEE Instrumentation & Measurement Magazine focused on selected papers that have been presented to the 2019 edition of AUTOTESTCON. As for every year, also last year this was a very successful and lively event. There were many attendees, interesting speeches and lots of sponsors and exhibitors. I'm sure that many of you have enjoyed the conference.