Analysis of EME produced by a microcontroller operation

This paper deals with the characterization of integrated circuit electromagnetic emissions. The TEM cell method is employed in order to identify primary emission sources of complex digital devices. An 8-bit microcontroller, realized by a 0.8 /spl mu/m HCMOS process is considered. It is composed of several building blocks like the central processing unit, the analog to digital converter and the EPROM memory. Emission measurements are performed by operating a specific program code stored in the microcontroller memory and emissions due to each building block are identified.