Effect of Penetrating Conductors on Enclosure HEMP Hardening

An electromagnetic modelling and simulation analysis carried out to study the effect of penetrating conductors on EMP Shielding Effectiveness (SE) of the shielded enclosure. Transient electromagnetic fields from an EMP source, which can induce currents into a conductor. This current will continue to flow on the conductor as it penetrates the shield boundary. The current flowing in the conductor will cause the re-radiation of an EMP field on the other side of the shielding boundary. For both plane wave and transient EMP SE with different positions of cable penetration into the shielded enclosure was analyzed, and based on the obtained results it recommends suitable cable penetration, to minimize the fields coupling inside the enclosure. This investigation will be utilized for routing the cables from the external electromagnetic environment to protect sensitive electronics systems inside the enclosure.