Laser Simulation of Transient Ionizing Radiation Effects in the Double-Power Integrated Circuit

Transient ionizing radiation produces instantaneous photocurrents which cause current and voltage disturbances in integrated circuits. In this paper, a 0.18μm bulk CMOS inverter chain circuit with core and IO power supplies is investigated by pulsed laser simulated the transient dose rate effects. The experimental results show the disturbance of output voltage is positively correlated with core and IO supply voltages, and more affected by the core voltage. The recovery time of output voltage depends on the recovery time of core power supply. 1.8V and 3.3V inverters with different supply voltages are simulated by Sentaurus TCAD. The results also show the disturbance of output voltage is positively correlated with power supply voltage, and the disturbance of supply voltage corresponds to the disturbance of supply current. It is indicated that power supply is an important factor affecting the transient ionizing radiation effects in integrated circuits.