Interactive Monitoring of Serial Electronic Circuit with Embedded Microcontroller

In this article, will discuss the continuation of the research that we have started in the past, in which have to realize high reliability electronic circuits with continuous circuit parameter monitoring. As previously reported, digital circuit simulation, non-aging circuit model, is used in an embedded microcontroller environment, including some tabular value comparison. The values of the nodal voltage of the digital representation of the test circuit are compared with the values of the real circuit node voltage. [12] [15]In this article, we want to develop an interactive test to break the entire circuit into sub-circuits and examine these smaller circuits between input and output. It is very important that the circuit being tested is tested so that the circuit function does not suffer damage to the entire system.[13] [8] [6]This article is a snapshot of the current state of research.