An Improved Through Line Fixture De-embedding Method Using VNA Measurement Data

In this paper, an improved through line-based fixture de-embedding method is proposed. By interpolating the original measurement S-parameter magnitude and phase of the vector network analyzer and obtaining the fixture parameters, the time resolution and time range changes of the existing method can be avoided. At the same time, the parameters of the fixture can be obtained without changing the instrument settings, and the applicability of the fixture de-embedding method based on the through line is improved. Finally, the effectiveness of the method was verified by testing the high-speed USB type C cable.