The Interface Effect in X-ray Testing of Concentric Multi-layer Materials

In this paper, the interface effect is firstly found in X-ray images of compound insulator. In order to eliminate the interface effect, this paper have carried out its related research. Firstly, based on the X-ray attenuation characteristics, a concentric multi-layer material model is established, and the conditions for the interface effect of X-ray penetration of the concentric multilayer material are theoretically analyzed. Then, X-DR (X-ray with Director Digital Panel Radiography) experiments verify the existence of interface effect of X-ray penetration, and the experimental results are consistent with the theoretical analysis. Finally, the computed tomography (CT) detection technology is adopted to eliminate this interface effect of X-ray penetration in this paper. The experimental results show that the system with CT detection can eliminate the interface effect of X-ray penetration. The system is beneficial for the inspectors to make correct fault detection on the equipment and avoid the consequences of false detection. This study provides an available NDT detection method for concentric multi-layer material structure equipment.