A Novel Six-Probe Method for the Measurement and Exact Reconstruction of a Pair of Parallel Profiles

A novel system and its corresponding method for the measurement and the exact reconstruction of a pair of parallel profiles are designed. There are six sensors installed on the measuring device and they are divided into two groups with different sensor spacings. The exact reconstruction can be realized under the condition of a high lateral resolution, as the straightness error, the yaw error, the zero-adjustment error, and the data processing error can be all eliminated through two scannings and certain data processing method. The measurement error of the displacement sensors can also be suppressed. The new method has the following advantages: (i) the realization of the exact reconstruction, (ii) a high lateral resolution of the reconstruction result which is independent of the sensor spacings, (iii) the skip of the zero calibration before the measurement process, and (iv) the suppression of the sensor random error. These advantages are demonstrated by the theoretical analyses and the simulations. Experiments are also conducted to prove some of these characteristics.