Impact of Miniature H-Field Probe on Measured Fields

As the size of elements on multi-layer PCBs gets smaller and smaller while the density of components on the board tends to get higher and higher with every new generation of electronic devices, it becomes critical to evaluate cross-talk, unwanted interference, backscattering, and emission events in the immediate vicinity of circuits. The assessment of the near-field zone is challenging because of the complex character of decoupled electric E and magnetic H fields. A new generation of near-field vector probes provide a solution for high-resolution measurements of the complex electromagnetic field. The presented study evaluates impact of the H-probe on the tested field. In this letter a 50Ω-terminated microstrip line (MSL) is used as a reference device for experimental and numerical analysis as a source of predominant E field. Experimental cross-talk of two probes, using a mini-loop as a source of predominant H field, is assessed.