Prediction of Trap Occupancy for Random Telegraph Noise Under Complex Waveforms

In this letter, an occupancy probability prediction (OPP) model is proposed for predicting the trap occupation states of random telegraph noise (RTN) under complex gate bias waveforms. This compact model is developed based on the random charging/discharging behaviors. It is verified by both theoretical simulations and experimental results. The model enables one to evaluate the state of each trap at any time under arbitrary bias, which is helpful for analyzing and simulating the trap-related reliability and variability issues in circuits.