New approach for extracting the noise wave correlation matrix for 2-port devices

This paper presents a new measurement technique for determining the noise wave correlation matrix of a two-port device and obtaining the four associated noise parameters: R
_n
, F
_min
and Y
_opt
(modulus and phasis). The measurement is based on a new analytical approach to determine the completeness of the noise correlation matrix in the sense of the scattering parameters (S).