Structural and Optical Analyses of PLZT Thin Films on Gallium-Doped Zinc Oxide Coated Glass Substrate

Lead lanthanum zirconate titanate (PLZT) (9/65/35) thin films were prepared on gallium-doped zinc oxide (GZO) coated glass substrates by sol-gel spin coating method for the first time in literature. Processing conditions such as pyrolysis and annealing temperature were selected as parameters to achieve high crystallinity and eliminate rosette phase. Optimum pyrolysis parameters were found as 200°C for 5 minutes and 430°C for 15 minutes to eliminate rosette phase and annealing temperature was selected as 725°C for 1 hour. These processing conditions resulted with 6.4
^%
-matrix phase while regular condition resulted with 19.8
^%
-matrix phase. Optical measurements were done in the range of 350-900 nm. Transmittance level of the films annealed at optimum condition were found as ~60% for 700nm wavelength and band gap levels were calculated as ~3.2 eV.