Design and Characteristic Calibration of TEM Cell for IC Radiation EMC Test

With the development of IC nano-meter technologies advancing toward higher operating frequencies and the trend of integrated various wireless communication systems for smart autonomous car, the self-driving system with highly integrated high-speed digital circuits and multi-radio modules are now facing the challenge from performance degradation by even more complicated platform EMI noisy environment. Thus the radiated EMC problem has become a crucial issue for IC adoption by automobile industry. Since TEM Cell could be used for EMI test (IEC 61967-2[1]) and EMS test (IEC 62132-2[2]) on chip or module level, we therefore design and investigate the structure of TEM cell and its characteristics for IC EMC test in this study. Finally, we will utilize the TEM cell designed in this study to measure the EMI emission generated from flash memory under different operation and working conditions.