Latch-Up Detection During ESD Soft Failure Characterization Using an On-Die Power Sensor

ESD-induced latch up is detected with an on-die energy counter circuit. Raw values are accessed through a Linux operating system kernel call, then the power consumption is calculated. Persistent power consumption increase indicates the latch-up occurrence, thus avoiding the need of external equipment for its detection. The failure mode is not visually noticeable and requires full power cycling to fully recover.