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Scan Integrity Tests for EDT Compression | IEEE Journals & Magazine | IEEE Xplore

Abstract:

Scan chains are the fundamental building blocks for DFT, and testing for scan integrity is the first step in a robust test methodology. This article describes scan integr...Show More

Abstract:

Scan chains are the fundamental building blocks for DFT, and testing for scan integrity is the first step in a robust test methodology. This article describes scan integrity tests for embedded test compression structures.
Published in: IEEE Design & Test ( Volume: 37, Issue: 4, August 2020)
Page(s): 21 - 26
Date of Publication: 20 January 2020

ISSN Information:


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