A new formula for effective dielectric constant in multi-dielectric layer microstrip structure | IEEE Conference Publication | IEEE Xplore

A new formula for effective dielectric constant in multi-dielectric layer microstrip structure


Abstract:

A simple expression of effective dielectric constant for a microstrip on a multi-layered substrate is derived with the quasi-TEM assumption and the superposition of parti...Show More

Abstract:

A simple expression of effective dielectric constant for a microstrip on a multi-layered substrate is derived with the quasi-TEM assumption and the superposition of partial capacitance. Our method for a single-layer substrate provides a difference of within 2.32% compared to full-wave simulation. For the double layer case, our results are less than 2.2% different with an enhanced spectral domain technique and 1.6% with a variation method.
Date of Conference: 23-25 October 2000
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-6450-3
Conference Location: Scottsdale, AZ, USA

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