Electric Field Mathematical Modelling at Probe Measurement in Anisotropic Semiconductor Films

The distribution of constant electric current potential in case of probe measurement on anisotropic semiconductors and fields has been studied. The expressions for potential distribution have been obtained. It enables to identify the area of the probe field of the scanning microscope in case an anisotropic film is under study. The results of the research demonstrate the correlation between the size and anisotropy of specific electroconductivity and the resistance change of probe spreading in limited films.