Immunity Model of the Embedded CAN Controller to Conducted Interferences

This paper addresses an Integrated Circuit Immunity Model-Conducted Immunity (ICIM-CI) of the embedded controller area network (CAN) controller in microcontroller to the conducted disturbances. The procedure is based on a gray-box approach to predict the behavior of a disturbed circuit. The parameters are estimated from time and frequency domain measurements, allowing accurate and efficient reproduction of nonlinear device switching behaviors. The immunity of the CAN controller is measured with the direct RF power injection method. The obtained model is successfully implemented to predict both the functional signals and the RF noise immunity at component level.