Planar Millimeter-Wave Waveguide Transition for Material Characterization at 79 GHz

This paper proposes a seamless planar millimeterwave microstrip to waveguide transition at 79 GHz in order to measure and characterize the Nippon Pillar's low-loss substrate material F260AS. The transition does not require additional mechanical fabrication steps. A back-to-back structure of the proposed transition is fabricated and measured to verify the design. Then the transition is utilized to extract the dielectric constant of the material under test employing the microstrip ring resonator method.