Radiation Evaluation of the Texas Instruments TPS7H2201-SP eFuse

Single Event Effects and Total Ionizing Dose characterization results for the TPS7H2201-SP are summarized. The data shows the device is SEL-free (at T$\approx$125 °C), SEB-free, SEGR-free, SEFI-free and SET-free (at T$\approx$23 °C) up to LET
EFF
=75 MeV$\cdot$ cm
²
/mg and across the full electrical specifications. The eFuse is also ELDRS-free with a TID rating of 100 krad(Si).